TexSEM Laboratories (TSL) supplies microanalytical systems and services
for the SEM and TEM. Based on electron backscatter diffraction in the SEM, TSL's
OIM and Delphi products provide microtexture mapping, grain boundary profiles, and
phase identification of polycrystalline samples. Using a patented combination of
dark field imaging and beam rotation TSL's Automated Crystallography for the TEM
(ACT) produces grain boundary maps and grain size statistics for nanocrystalline
thin films within minutes.
TSL is a subsidiary of EDAX, Inc. which is the world leader in the design and manufacturing of energy dispersive x-ray analysis systems.
TexSEM Laboratories, Inc
a subsidiary of EDAX, Inc.
392 East 12300 South, Suite H
Draper, Utah 84020
Fax: (801) 495-2758
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