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13th International Conference on Defects —
Recognition, Imaging and Physics in Semiconductors (DRIP XIII)

DRIP XIII • SEPTEMBER 13-17, 2009 • WHEELING, WEST VIRGINIA, USA

DRIP XIII: Committee Organizers

The 13th International Conference on Defects — Recognition, Imaging and Physics in Semiconductors has been organized by the following committees and individuals:

ORGANZING COMMITTEE

 

Mark Dexter
Texas Instruments

Michael Dudley
SUNY Stony Brook

Piotr Edelman
SDI

Mark S. Goorsky
UCLA

Andrew M. Hoff
University of South Florida

Philip G. Neudeck
NASA GRC

 

Steven A. Ringel
The Ohio State University

Marek Skowronski
Carnegie Mellon University

Peilin Song
IBM T.J. Watson Research Center

Robert E. Stahlbush
Naval Research Laboratory

Michio Tajima
Japan Space Exploration Agency

Jens W. Tomm
Max Born Institute (Germany)


PROCEEDING EDITORS

 

Piotr Edelman
SDI

 

Andrew M. Hoff
University of South Florida


INTERNATIONAL STEERING COMMITTEE

 

France Jean-Pierre Fillard
Honorary Member, France
France

Paul Montgomery
France

Japan

Tomoya Ogawa
Honorary Member, Japan

Japan

Takashi Sekiguchi
Japan

Germany

Martina Baeumler
Germany

USA

Marek Skowronski
USA

Italy

Anna Cavallini
Italy

Japan

Michio Tajima
Japan

USA

Piotr Edelman
USA

Germany

Jens W. Tomm
Germany

Italy

Cesare Frigeri
Italy

China

Zhanguo Wang
China

Spain

Juan Jimenez
Spain

Poland

Jan Weyher
Poland, The Netherlands

France

Jean-Pierre Landesman
France

China

Deren Yang
China

USA Alan Mickelson
USA
   

FOR MORE INFORMATION . . .


For general inquiries regarding the committees, please contact:

Professor Marek Skowronski, DRIP XIII Chair
Carnegie Mellon University, Pittsburgh, Pennsylvania
E-mail: Phone: (412) 268-2710

For more information about this conference, please submit a form or contact:

TMS Meeting Services
184 Thorn Hill Road
Warrendale , PA 15086-7514 USA
Telephone (724) 776-9000, ext. 243
(800) 759-4TMS
Fax: (724) 776-3770
E-mail:


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