TMS ONLINE | MEMBERS ONLY | SITE MAP 13th International Conference on Defects — Recognition, Imaging and Physics in Semiconductors (DRIP XIII) |
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DRIP XIII: Technical Program ScopeConference attendees will learn about all aspects of defects in materials growth, processing, and device fabrication. Recent research and developments in semiconductor defects will be presented concerning recognition, imaging, characterization, origin and properties, and effect on device performance and reliability.
The following represent the overall technical scope and related topics:
For inquires regarding the program, please contact:
For more information about this conference, please submit a meeting information request form or contact:
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