TMS2019 Professional Development Events

Atom-Probe Tomography: A Primer

PLEASE NOTE: This course has been cancelled for TMS2019.

When
Sunday, March 10, 2019 • 8:00 a.m. to 5:30 p.m.
Where
San Antonio, Texas
Sponsorship
TMS Advanced Characterization, Testing, and Simulation Committee
Instructors
Keith Knipling, Research Scientist, U.S. Naval Research Laboratory; David Larson, Director of Scientific Marketing, CAMECA Scientific Instruments; Baishakhi Mazumder, Assistant Professor, University at Buffalo; Jonathan Poplawsky, Research Associate, Oak Ridge National Laboratory, FAA

Scope

Atom-Probe Tomography (APT) is a precise atom-by-atom dissection of a material volume, producing three-dimensional atomic-scale reconstructions, with sub-nanometer resolution, and chemical sensitivities approaching 10 atomic ppm. This full-day workshop, aimed at experienced users, will provide a comprehensive view of the state-of-the-art of the atom-probe technique. The course will first cover the basic physics of field-evaporation and time-of-flight mass spectroscopy, establishing advantages and limitations of APT and means for optimizing data fidelity. A review of sample preparation techniques will include electropolishing and focused ion beam (FIB) approaches, site-specific liftout techniques, capping considerations to preserve regions of interest, correlative microscopy using transmission electron microscopy and transmission Kikuchi diffraction, and cryogenic cooling necessary for analysis of biological materials. Next, “best practice” analytical parameters for a variety of materials will be presented, providing practical information to initiate successful APT experiments. The course will conclude with an intensive hands-on session covering advanced features of the CAMECA interactive visualization and analysis software (IVAS), including compositional profiles, proximity histograms, cluster analysis, interface analysis, and methods for achieving perfection in atomic positioning in the reconstruction.

Who Attends?

Experienced users in atom-probe technique.

Learning Objectives

Participants will:
  • Gain a comprehensive view of the state-of-the-art of the atom-probe technique
  • Learn “best practice” analytical parameters for a variety of materials
  • Receive intensive hands-on practice using advanced features of the CAMECA interactive visualization and analysis software (IVAS)

Registration Rates

Registering As Advance Registration Rate
(on or before February 1)
 Standard Registration Rate
(after February 1)
Member* $525 $600
Non-member* $575 $650
Student* $300 $350

*Please note: All registration rates include lunch.

How To Register

This course has been cancelled for TMS2019 and is no longer be accepting registrations.

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