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Characterization of the Dislocation Density Tensor with Whit

Characterization of the Dislocation Density Tensor with White Beam Diffraction
R.I. Barabash, G. E. Ice, J. Pang and W. Liu

KEY WORDS Characterization, Mechanical Properties, Modeling and Simulation

Polychromatic diffraction is sensitive to the density and organization of the dislocations, which occurs at several structural levels. At the lowest level individual dislocations can exist within a crystal. At a higher structural level dislocations can organize into strongly correlated arrangements including walls and sub-boundaries. The distribution of scattered intensity is sensitive to these dislocation ensembles. A primary set of unpaired (geometrically necessary) dislocations or dislocation walls and subboundaries results in elongated streaks in the Laue image. The direction of the streak depends on the mutual orientation of the activated dislocation slip systems and on the components of the dislocation density tensor.

This paper is included in TMS Letters,Vol. 1:1 (2004).

Publisher: TMS
Product Format: PDF
Pages: 13-14
Date Published: January 1, 2004

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