To assess the feasibility of using electron-channeling contrast imaging (ECCI) for measurements of dislocation densities, deformation structures in warm rolled commercially pure Ti have been examined. Samples were rolled to thickness reductions of 1.08%, 2.16%, 5.17%, and 15.05% at 366K. ECCI, a scanning electron microscopy technique that allows imaging of near surface dislocations in bulk samples [1], was carried out on the deformed samples. Dislocation densities were determined by measuring the number of dislocation/surface intersections per unit area. Electron backscattered diffraction (EBSD) patterns were used to determine the orientation of individual grains, facilitating identification of the active slip planes through trace analysis. ECCI is shown to be an effective way to rapidly measure dislocation densities up to the range of 10¹⁴/m².

This paper is included in TMS Letters,Vol. 1:1 (2004).

Publisher: TMS
Product Format: PDF
Pages: 15-16
Date Published: January 1, 2004