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TMS ONLINE | MEMBERS ONLY | SITE MAP 13th International Conference on Defects — Recognition, Imaging and Physics in Semiconductors (DRIP XIII) |
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TECHNICAL PROGRAM FINAL TECHNICAL PROGRAM HOUSING RESERVATIONS Authors presenting their work at the DRIP XIII Conference are encouraged to submit a manuscript for consideration for publication in the conference proceedings.
Proceedings will appear as a special issue of the Journal of Electronic Materials (JEM). JEM is a monthly archival technical journal published by TMS and the Institute of Electrical and Electronics Engineers (IEEE). The journal contains technical papers detailing critical new developments in the electronic materials field, as well as invited and contributed review papers on topics of current interest. Visit the JEM home page for more information.
The deadline for submissions is September 20, 2009. Manuscript Guidelines: Submission Guidelines:
For inquiries regarding Proceedings, please contact the Proceedings Editors:
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