Submit an Abstract
Share your work—submit an abstract by January 14, 2019.
The key goals of ICME 2019 are to convene stakeholders from across all areas of modeling and simulation, experimental specialization, and design, as well as from across academia, government, and industry, to address ICME tools and techniques and their integration, as well as to examine their application in engineering. This congress will provide a forum for presentations and discussions centering on ICME-related topics, including:
ICME has emerged as an important discipline because of its great potential in efficiently designing new materials, engineering new products, and improving manufacturing processes. ICME methodologies can identify gaps in the integration process when applied to solving fundamental engineering problems, these can lead to advancements in the fundamental understanding of problems, development of the linkages along the processing chain, and development of computational tools and advanced experimental technique for engineering practice and the establishment of an infrastructure for global information sharing.
Abstracts must be submitted to ProgramMaster by January 14, 2019, to be considered for inclusion in the congress.
To assist the congress organizing committee in evaluating abstracts fairly, please be as clear and detailed in your abstract as possible. Abstracts should be 150 words.
If you have any questions regarding abstract submission, send an e-mail to TMS Programming Staff.
View the final programs from past ICME congresses
A journal publishing initiative has been planned for ICME 2019. More details on specific options will be provided before and during the congress.
Annika Borgenstam, Thermo-Calc (Sweden)
Kees Bos, Tata Steel (Netherlands)
Long-Qing Chen, Pennsylvania State University (USA)
Peter Collins, Iowa State University (USA)
Mary Lee Gambone, Rolls-Royce (USA)
Alan Luo, The Ohio State University (USA)
Michele Manuel, University of Florida (USA)
David Rowenhorst, U.S. Naval Research Laboratory (USA)
Yanjing Su, University of Science and Technology Beijing (China)
James Warren, National Institute of Standards and Technology (USA)
For more information about this meeting, please complete the meeting inquiry form or contact:
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