JOM Editorial Calendar - Topic Details

Advanced Characterization of Interfaces and Thin Films

Access all papers from this issue here.

This topic is no longer accepting submissions.

Guest Editor: Vikas Tomar
Co-Guest Editors: Ritesh Sachan
Publication Date: April 2018
Keywords: Additive Manufacturing,Advanced Materials,Biomaterials,Characterization,Composites,Ceramics,Computational Materials Science & Engineering,High-Temperature Materials,ICME,Manufacturing and Markets,Mechanical Properties,Modeling and Simulation,Nanotechnology,Nuclear Materials,Surface Modification and Coatings,Synthesis and Processing,Thin Films and Interfaces
Scope: Interfaces play an important role in modifying materials properties: structural, electronic, optical and magnetic, etc. The focus of this topic is the advanced characterization of materials interfaces at atomic and nanoscales in metal, alloys, ceramics and polymers by various in situ and ex situ experimental techniques such as raman spectroscopy,x-ray and neutron diffraction, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and atomic force microscopy (AFM). This topic also involves the understanding of materials interfaces by theoretical modeling approaches (e.g., finite element analysis, molecular dynamic, and Monte Carlo simulations) that allow the study of these processes on the atomic and molecular levels.