CANCELLED: Interaction of High Energy Beam with Specimens
This topic is no longer accepting submissions.
Publication Date: December 2022
Keywords: Characterization, Experimental Methods, Artifact
Papers are invited to discuss various aspects of potential defects that may be introduced in electron and ion beam microscopy, and mitigation
strategies. This includes SEM, TEM, FIB and laser microscopy. Potential focus areas include but are not limited to beam-materials interactions, the use of high energy beam for materials modifications, and defects generated as a result of beam-specimen interaction (e.g. implantation, amorphization, beam heating and beam-induced phase transformation).