JOM Editorial Calendar - Topic Details

Microstructure Characterization: Descriptors, Data-Intensive Techniques, and Uncertainty Quantification (By Invitation Only)

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Guest Editor: Srikanth Patala
Co-Guest Editors: Shawn Coleman
Publication Date: July 2021
Keywords: Advanced materials, characterization, computational materials science & engineering, microstructure, uncertainty quantification, ICME
Scope: Advancements in computational processing power, instrument and detector capabilities, and multi-scale modeling techniques are generating increasingly large three-dimensional microstructural datasets that have facilitated the discovery of quantitative descriptors linking processing parameters to material properties. This special topic will focus on theoretical and computational developments of novel descriptors to characterize microstructural features. Also invited are papers that apply advanced statistical techniques, such as machine learning and uncertainty quantification, for collecting, analyzing and reconstructing experimental microstructural datasets.