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June 22-24 • Santa Barbara, California
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View the presentation, "Effect of Carbonization Process Conditions on Surface Morphology of 3C-SiC Films Grown on Si Substrates" as a sample abstract
and extended abstract.
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EMC 2011: Proceedings
June 22-24, 2011 • University of California • Santa Barbara, CA
New In 2011! Submit your manuscript for a Special Issue of the Journal of Electronic Materials (JEM). All EMC authors will have the opportunity to be published in a special edition of
The Journal of Electronic Materials (JEM), which will feature collected papers from the entire Electronic Materials Conference 2011.
MANUSCRIPT SUBMISSIONS
JEM employs an online manuscript submission and review system. To be
considered for publication, authors must submit manuscripts electronically.
Detailed submission guidelines are available from the publisher’s web site
at manuscript preparation guidelines.
Manuscripts will be accepted from June 15, 2011 to August 1, 2011. Submissions are accepted through via Electronic Submission under the category "2011 EMC".
All papers will be peer-reviewed and must meet the same standards for acceptance
as regular papers.
ABOUT JEM
 JEM is a monthly archival technical journal of TMS and the Institute of Electrical and Electronics Engineers (IEEE). Articles are reviewed, selected
and edited by peers who serve as voluntary members of the editorial
board, associate editors, and guest editors.
JEM is a forum for the rapid circulation of original research. It contains
technical papers detailing critical new developments in the electronic materials
field, as well as invited and contributed review articles on topics of
current interest. The journal focuses on semiconductors for transistors,
detectors, emitters, photovoltaics, and thermoelectrics. It also addresses
dielectrics and contact metals, as well as materials for electronic packaging.
Additionally, the journal publishes articles on nanofabrication, materials
synthesis, crystal growth, electronic properties, optical properties, and
reliability.
JEM Subscriptions
TMS and IEEE members receive a discount on subscriptions! Individuals may subscribe to
JEM by
contacting Springer, the journal’s publisher, at:
FOR MORE INFO...
For more information about this meeting, please complete the meeting inquiry form or contact:
TMS Meeting Services
184 Thorn Hill Road
Warrendale , PA 15086-7514 USA
Telephone (724) 776-9000, ext. 243
(800) 759-4TMS
Fax: (724) 776-3770
E-mail: mtgserv@tms.org
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