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June 22-24 • Santa Barbara, California

Symposia Proposals
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Session Building
Manuscript Submissions
Manuscript Review
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View the presentation, "Effect of Carbonization Process Conditions on Surface Morphology of 3C-SiC Films Grown on Si Substrates" as a sample abstract and extended abstract.

EMC 2011: Proceedings
June 22-24, 2011 • University of California • Santa Barbara, CA

New In 2011! Submit your manuscript for a Special Issue of the Journal of Electronic Materials (JEM). All EMC authors will have the opportunity to be published in a special edition of The Journal of Electronic Materials (JEM), which will feature collected papers from the entire Electronic Materials Conference 2011.


JEM employs an online manuscript submission and review system. To be considered for publication, authors must submit manuscripts electronically. Detailed submission guidelines are available from the publisher’s web site at manuscript preparation guidelines.

Manuscripts will be accepted from June 15, 2011 to August 1, 2011. Submissions are accepted through via Electronic Submission under the category "2011 EMC". All papers will be peer-reviewed and must meet the same standards for acceptance as regular papers.


JEM coverJEM is a monthly archival technical journal of TMS and the Institute of Electrical and Electronics Engineers (IEEE). Articles are reviewed, selected and edited by peers who serve as voluntary members of the editorial board, associate editors, and guest editors.

JEM is a forum for the rapid circulation of original research. It contains technical papers detailing critical new developments in the electronic materials field, as well as invited and contributed review articles on topics of current interest. The journal focuses on semiconductors for transistors, detectors, emitters, photovoltaics, and thermoelectrics. It also addresses dielectrics and contact metals, as well as materials for electronic packaging. Additionally, the journal publishes articles on nanofabrication, materials synthesis, crystal growth, electronic properties, optical properties, and reliability.

JEM Subscriptions
TMS and IEEE members receive a discount on subscriptions! Individuals may subscribe to JEM by contacting Springer, the journal’s publisher, at:


For more information about this meeting, please complete the meeting inquiry form or contact:

TMS Meeting Services
184 Thorn Hill Road
Warrendale , PA 15086-7514 USA
Telephone (724) 776-9000, ext. 243
(800) 759-4TMS
Fax: (724) 776-3770