Beam Induced Artifacts in Electron and Ion Beam Microscopy
Manuscript Submission Deadline:
March 01, 2022
Publication Date: September 2022
Keywords: Characterization, Experimental Methods, Artifact
Scope: Papers are invited to discuss various aspects of potential defects that may be introduced in electron and ion beam microscopy, and mitigation strategies. This includes SEM, TEM and FIB microscopy. Potential focus areas include but are not limited to artifacts resulting from beam damage, beam heating, beam-induced phase transformation, etc..
Call for Papers