JOM Editorial Calendar - Topic Details

Advanced Characterization of Interfaces and Thin Films

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Guest Editor: Ritesh Sachan
Co-Guest Editors: Manuel Roldan Gutierrez
Publication Date: June 2020
Keywords: Advanced Materials, Electronic Materials, Energy Conversion and Storage
Scope: Interfaces play an important role in modifying materials properties--structural, electronic, optical and magnetic, etc. The focus of this topic is the advanced characterization of materials interfaces at atomic and nanoscales in metal, alloys, ceramics, and polymers by various in-situ and ex-situ experimental techniques such as x-ray and neutron diffraction, scanning electron microscopy, transmission electron microscopy, and atomic force microscopy. This topic also involves the understanding of materials interfaces by theoretical modeling approaches that allow the study of these processes on the atomic and molecular level.