JOM Editorial Calendar - Topic Details

Cutting Edge In Situ Characterization Techniques

Manuscript Submission Deadline: June 01, 2024
Guest Editor: Zhiwei Peng
Co-Guest Editors: Jian Li
Publication Date: December 2024
Keywords: , In Situ Characterization, Thermogravimetry, Imaging, Microscopy, X-Ray Technology, Neutron Technology, Spectroscopy
Scope: In situ characterization techniques are critical for precisely characterizing materials and physiochemical processes. Typical techniques are in situ thermogravimetry (TG), in situ thermal imaging (TI), in situ optical microscope (OM), in situ scanning electron microscopy (SEM), in situ transmission electron microscopy (TEM)), in situ X-ray diffraction (XRD), in situ X-ray photoelectron spectroscopy (XPS), in situ near-edge X-ray absorption fine structure spectroscopy (NEXAFS), in situ X-ray tomography, in situ neutron diffraction (ND), in situ neutron depth profiling (NDP), in situ Raman spectroscopy, in situ nuclear magnetic resonance (NMR), and in situ nuclear magnetic resonance imaging (MRI). This topic covers recent advancements in the applications of cutting edge in situ characterization techniques for all aspects of minerals processing, physical and process metallurgy, and materials science and engineering.
Call for Papers: Download

How to Submit a Manuscript

Please read the detailed Instructions for Authors and upload your manuscript at the Editorial Manager website for JOM. To ensure sufficient time for peer review, papers will not be accepted after the posted manuscript submission deadline. Original research papers should be 3,000-9,000 words with up to 12 figures maximum; review papers should be 6,000-11,000 words with up to 20 figures maximum.

Share this Topic